Showing results: 2251 - 2265 of 2716 items found.
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Xitron Technologies Inc.
Vitrek hipot testers serve a range of different industries and are designed by experts who have made the company a global leader for supporting electrical safety tests. Each series of hipot testers is designed to handle AC and DC hipot, and select models can also measure IR insulation resistance. Vitrek manufactures two different series of hipot and electrical safety testers. These hipot testers have been designed to fit your testing application. Each series offers 6 different models with a wide variety of electrical safety test functions and capabilities.
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CSW Series -
AMETEK Programmable Power, Inc.
The CSW Series represents a new generation of AC/DC power sources that address the increasing demands on test equipment to perform additional functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the Compact CSW Series is capable of handling complex applications that have traditionally required multiple systems. The sleek integrated approach of the CSW avoids cable clutter that is commonly found in test systems. All connections are made internally and the need for digital multimeters, power harmonics analyzers, and current shunts or clamps is eliminated.
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LEON Fixture -
Konrad Technologies GmbH
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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62000H -
Chroma Systems Solutions, Inc.
Chroma’s new 62000H Series of programmable DC Power Supplies offer many unique advantages for telecom, automated test system & integration, industrial, battery charge & simulation for hybrid cars and solar panel simulation. These advantages include a high power density of 15KW in 3U, precision readback of output current and voltage, output trigger signals, as well as the ability to create complex DC transients waveforms to test device behavior to spikes, drops, and other voltage deviations. For high power applications, parallel up to 10 units for up to 150kW.
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780159-02 -
NI
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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780159-01 -
NI
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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5000E -
Scientific Test, Inc.
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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PA series -
Aarohi Embedded Systems Pvt. Ltd
The PA series is the enhanced version of Aarohi’s 2th generation of compact power analyzer. The world’s best-selling power analyzer is the instrument of choice for a wide range of applications in production testing, quality assurance and Research & Development. Aarohi power analyzers are easy to use, cost effective and accurate for diverse applications such as the testing of electric devices, the development and evaluation of Pump Industries, Motor Industries, home appliances , AC motor driven instruments. The outstanding performance of the AES PPTQ and motor analyzer software enables users to easily test their instruments & record data.
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779122-01 -
NI
32 AI (18-Bit, 625 kS/s), 48 DIO, PXI Multifunction I/O Module—The PXI‑6284 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779120-01 -
NI
16 AI (18-Bit, 625 kS/s), 24 DIO, PXI Multifunction I/O Module—The PXI‑6280 offers analog input, correlated digital I/O, two 32‑bit counter/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779108-01 -
NI
16 AI (18-Bit, 625 kS/s), 24 DIO PCI Multifunction I/O Device - The PCI‑6280 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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779110-01 -
NI
32 AI (18-Bit, 625 kS/s), 48 DIO PCI Multifunction I/O Device - The PCI‑6284 offers analog input, correlated digital I/O, two 32‑bit counters/timers, and analog and digital triggering. The device delivers low-cost, reliable DAQ capabilities in a wide range of applications from simple applications in laboratory automation, research, design verification/test, and manufacturing test. You can add sensor and high-voltage measurement capability to your device with SCC or SCXI signal conditioning modules. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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Data Patterns Pvt. Ltd.
Built in strict adherence to open architecture standards, Data Patterns designs COTS module products which are used in today's rugged applications and automatic test equipment platforms. Open standard form factors include cPCI, FMC & XMC, IP, MM, PCI, PCMCIA, PMC, VME, VPX and VXI.A portfolio of 'Off the Shelf ' products for testing and on-board applications have been developed by Data Patterns. COTS boards developed have been sold to many customers, in India as well as Europe and North America. They are used for system level products such as Automatic Test Equipment, Rugged Military Electronics, etc.Data Patterns focus on building COTS product is to provide the technological capability to develop system level products with very fast run around times. Use of Data Patterns' COTS module in system level products ensures Data Patterns ability to maintain the products for a significantly longer life cycle. The proximity to the system level engineering team with the COTS development team ensures that end applications are delivered faster, enabling a shorter time to market for the customers
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JT 37x7/TSI -
JTAG Technologies Inc.
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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783485-01 -
NI
Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
